(mobo import Concept___Event_Series-migrated) |
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{{Event Series | {{Event Series | ||
|Acronym=ICMTS | |Acronym=ICMTS | ||
|Title=International Conference on Microelectronic Test Structures | |Title=International Conference on Microelectronic Test Structures | ||
| + | |Academic Field=Microelectronics | ||
| + | |Official Website=http://www.icmts.net | ||
|pageCreator=User:Curator 53 | |pageCreator=User:Curator 53 | ||
|pageEditor=User:Curator 53 | |pageEditor=User:Curator 53 | ||
|contributionType=1 | |contributionType=1 | ||
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| − | |||
}} | }} | ||
{{Event Series Related Identifier}} | {{Event Series Related Identifier}} | ||
| + | {{Maintainer | ||
| + | |Contributor Type=organization | ||
| + | |Organization=IEEE Electron Devices Society, Institute of Electrical and Electronics Engineers | ||
| + | }} | ||
{{S Event Series}} | {{S Event Series}} | ||
| + | {{Main Image}} | ||
Revision as of 13:21, 10 October 2023
Events
