(mobo import Concept___Event_Series_For_Confident-migrated) |
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{{Event Series | {{Event Series | ||
|Acronym=ICMTS | |Acronym=ICMTS | ||
|Title=International Conference on Microelectronic Test Structures | |Title=International Conference on Microelectronic Test Structures | ||
+ | |Academic Field=Microelectronics | ||
+ | |Official Website=http://www.icmts.net | ||
+ | |DOI=10.25798/bpa6-ch73 | ||
|pageCreator=User:Curator 53 | |pageCreator=User:Curator 53 | ||
|pageEditor=User:Curator 53 | |pageEditor=User:Curator 53 | ||
|contributionType=1 | |contributionType=1 | ||
− | |||
}} | }} | ||
{{Event Series Related Identifier}} | {{Event Series Related Identifier}} | ||
− | {{ | + | {{Maintainer |
− | | | + | |Contributor Type=organization |
+ | |Organization=IEEE Electron Devices Society, Institute of Electrical and Electronics Engineers | ||
}} | }} | ||
{{S Event Series}} | {{S Event Series}} | ||
+ | {{Main Image}} |
Latest revision as of 08:33, 11 October 2023
Events