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|Title=IEEE International Workshop on Electronic Design, Test and Application | |Title=IEEE International Workshop on Electronic Design, Test and Application | ||
|Type=Workshop | |Type=Workshop | ||
− | | | + | |Official Website=www.ece.ust.hk/delta2008/Call.htm |
|City=Kowloon | |City=Kowloon | ||
|Country=Country:CN | |Country=Country:CN |
Revision as of 13:08, 19 October 2022
Deadlines
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Abstract |
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Submission |
Venue
Kowloon, China
Warning: Venue is missing. The map might not show the exact location.
This CfP was obtained from WikiCFP