(mobo import Concept___Events_With_Academic_Fields-migrated) |
Curator 91 (talk | contribs) |
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|Acronym=IDT 2006 | |Acronym=IDT 2006 | ||
|Title=3rd IEEE International Design and Test Workshop | |Title=3rd IEEE International Design and Test Workshop | ||
+ | |In Event Series=Event Series:IDT | ||
+ | |Single Day Event=no | ||
+ | |Start Date=2008/12/20 | ||
+ | |End Date=2008/12/22 | ||
+ | |Academic Field=Very Large-Scale Integration | ||
|Type=Workshop | |Type=Workshop | ||
|Homepage=www.enis.rnu.tn/tttc-idt | |Homepage=www.enis.rnu.tn/tttc-idt | ||
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|pageCreator=84.185.91.216 | |pageCreator=84.185.91.216 | ||
|contributionType=1 | |contributionType=1 | ||
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}} | }} | ||
''Source:'' https://mail.in.tu-clausthal.de/Lists/event/Message/910.html?Language=english | ''Source:'' https://mail.in.tu-clausthal.de/Lists/event/Message/910.html?Language=english |