(mobo import Concept___Event_For_Confident-migrated) |
(mobo import Concept___Events_With_Academic_Fields-migrated) |
||
| Line 3: | Line 3: | ||
|Title=3rd IEEE International Design and Test Workshop | |Title=3rd IEEE International Design and Test Workshop | ||
|Type=Workshop | |Type=Workshop | ||
| − | |||
|Homepage=www.enis.rnu.tn/tttc-idt | |Homepage=www.enis.rnu.tn/tttc-idt | ||
|City=Monastir | |City=Monastir | ||
| Line 13: | Line 12: | ||
|Start Date=2008/12/20 | |Start Date=2008/12/20 | ||
|End Date=2008/12/22 | |End Date=2008/12/22 | ||
| + | |Academic Field=VLSI Design | ||
}} | }} | ||
''Source:'' https://mail.in.tu-clausthal.de/Lists/event/Message/910.html?Language=english | ''Source:'' https://mail.in.tu-clausthal.de/Lists/event/Message/910.html?Language=english | ||
OpenResearchStack: 0.0.29
Confident: 1.9.10
