m (Text replacement - "=User:Curator 83" to "=Ch") |
(mobo import Concept___Events_With_Academic_Fields-migrated) |
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|Title=IEEE Circuits and Systems International Conference on Testing and Diagnosis | |Title=IEEE Circuits and Systems International Conference on Testing and Diagnosis | ||
|Type=Conference | |Type=Conference | ||
− | |||
|Homepage=ictd08.uestc.edu.cn/index.php?show=call4paper | |Homepage=ictd08.uestc.edu.cn/index.php?show=call4paper | ||
|City=Chengdu | |City=Chengdu | ||
Line 15: | Line 14: | ||
|Start Date=Oct 25, 2008 | |Start Date=Oct 25, 2008 | ||
|End Date=Oct 26, 2008 | |End Date=Oct 26, 2008 | ||
+ | |Academic Field=Computer Architecture | ||
}} | }} | ||
<pre></pre>This CfP was obtained from [http://www.wikicfp.com/cfp/servlet/event.showcfp?eventid=2973&copyownerid=2 WikiCFP] | <pre></pre>This CfP was obtained from [http://www.wikicfp.com/cfp/servlet/event.showcfp?eventid=2973&copyownerid=2 WikiCFP] |
Revision as of 13:26, 24 August 2022
This CfP was obtained from WikiCFP