Difference between revisions of "Event:8fa840df-ef25-4f50-9d47-a1e0b9bd9d11"

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(Created page with "{{Event |Acronym=ICMTS 2023 |Title=International Conference on Microelectronic Test Structures 2023 |Ordinal=35 |In Event Series=Event Series:ICMTS |Single Day Event=no |Start...")
 
 
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|Country=Country:JP
 
|Country=Country:JP
 
|Academic Field=Microelectronics
 
|Academic Field=Microelectronics
|Official Website=https://icmts.net/archives/program2023.html
+
|Official Website=http://icmts.if.t.u-tokyo.ac.jp/icmts.if.t.u-tokyo.ac.jp_8080/index.html
 +
|DOI=10.25798/gtmz-r658
 
}}
 
}}
 
{{Event Deadline}}
 
{{Event Deadline}}

Latest revision as of 08:33, 11 October 2023

Deadlines
organization
Metrics
Venue

University of Tokyo (Asano Section), Tokyo, Japan

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