Curator 91 (talk | contribs) |
Curator 91 (talk | contribs) |
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{{Event | {{Event | ||
|Acronym=ICMTS 2018 | |Acronym=ICMTS 2018 | ||
− | |Title=IEEE International Conference on Microelectronic Test Structures | + | |Title=31st IEEE International Conference on Microelectronic Test Structures |
|Ordinal=31 | |Ordinal=31 | ||
|In Event Series=Event Series:ICMTS | |In Event Series=Event Series:ICMTS | ||
Line 7: | Line 7: | ||
|Start Date=2018/03/19 | |Start Date=2018/03/19 | ||
|End Date=2018/03/22 | |End Date=2018/03/22 | ||
+ | |Event Status=as scheduled | ||
+ | |Event Mode=on site | ||
+ | |Venue=Courtyard Austin Downtown/Convention Center | ||
+ | |City=Austin | ||
+ | |Region=Texas | ||
+ | |Country=Country:US | ||
+ | |Academic Field=Microelectronics | ||
+ | |Official Website=https://icmts.net/archives/program2018.html | ||
|Type=Conference | |Type=Conference | ||
|gndId=1169681158 | |gndId=1169681158 | ||
− | |||
− | |||
− | |||
− | |||
|has Proceedings Link=https://ieeexplore.ieee.org/servlet/opac?punumber=8375243 | |has Proceedings Link=https://ieeexplore.ieee.org/servlet/opac?punumber=8375243 | ||
|has Proceedings link=https://ieeexplore.ieee.org/servlet/opac?punumber=8375243 | |has Proceedings link=https://ieeexplore.ieee.org/servlet/opac?punumber=8375243 | ||
Line 20: | Line 24: | ||
|contributionType=1 | |contributionType=1 | ||
}} | }} | ||
+ | {{Event Deadline}} | ||
+ | {{Organizer | ||
+ | |Contributor Type=organization | ||
+ | |Organization=IEEE Electron Devices Society, Institute of Electrical and Electronics Engineers | ||
+ | }} | ||
+ | {{Event Metric}} | ||
+ | {{S Event}} |
Latest revision as of 13:52, 10 October 2023
Deadlines
Metrics
Venue
Courtyard Austin Downtown/Convention Center, Austin, Texas, United States of America