(mobo import Concept___Event_Series_For_Confident-migrated) |
Curator 90 (talk | contribs) |
||
(3 intermediate revisions by 2 users not shown) | |||
Line 1: | Line 1: | ||
− | |||
{{Event Series | {{Event Series | ||
|Acronym=ITC | |Acronym=ITC | ||
|Title=IEEE International Test Conference | |Title=IEEE International Test Conference | ||
+ | |Academic Field=Electrical Engineering | ||
+ | |DOI=10.25798/vxrd-9c65 | ||
|pageCreator=User:Curator 89 | |pageCreator=User:Curator 89 | ||
|pageEditor=User:Curator 89 | |pageEditor=User:Curator 89 | ||
|contributionType=1 | |contributionType=1 | ||
}} | }} | ||
− | {{Event Series Related Identifier}} | + | {{Event Series Related Identifier |
− | {{ | + | |DBLP Series ID=itc |
− | | | + | |Wikidata Series ID=Q106431226 |
+ | |WikiCFP Series ID=1779&s | ||
+ | }} | ||
+ | {{Maintainer | ||
+ | |Contributor Type=organization | ||
+ | |Organization=Institute of Electrical and Electronics Engineers | ||
}} | }} | ||
{{Event Series CORE Ranking | {{Event Series CORE Ranking | ||
Line 16: | Line 22: | ||
}} | }} | ||
{{S Event Series}} | {{S Event Series}} | ||
+ | {{Main Image}} |
Latest revision as of 10:18, 4 April 2023
Events