Curator 90 (talk | contribs) |
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|Title=IEEE International Test Conference | |Title=IEEE International Test Conference | ||
|Academic Field=Electrical Engineering | |Academic Field=Electrical Engineering | ||
| + | |DOI=10.25798/vxrd-9c65 | ||
|pageCreator=User:Curator 89 | |pageCreator=User:Curator 89 | ||
|pageEditor=User:Curator 89 | |pageEditor=User:Curator 89 | ||
|contributionType=1 | |contributionType=1 | ||
}} | }} | ||
| − | {{Event Series Related Identifier}} | + | {{Event Series Related Identifier |
| + | |DBLP Series ID=itc | ||
| + | |Wikidata Series ID=Q106431226 | ||
| + | |WikiCFP Series ID=1779&s | ||
| + | }} | ||
{{Maintainer | {{Maintainer | ||
|Contributor Type=organization | |Contributor Type=organization | ||
Latest revision as of 10:18, 4 April 2023
Events
