Difference between revisions of "Event:VNC 2015"

From ConfIDent
(mobo import Concept___Events-migrated)
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{{Event
 
{{Event
|Acronym=VNC 2015
+
|Acronym=DBT 2007
|Title=2015 IEEE Vehicular Networking Conference (VNC)
+
|Title=IEEE International Workshop on Current and Defect Based Testing
|Ordinal=7
+
|Type=Workshop
|In Event Series=Event Series:VNC
+
|Homepage=dbt.tttc-events.org
 +
|City=Santa Clara
 +
|State=CA
 +
|Country=Country:US
 +
|wikicfpId=1366
 +
|pageCreator=127.0.0.1
 +
|contributionType=1
 
|Single Day Event=no
 
|Single Day Event=no
|Start Date=2015/12/16
+
|Start Date=Oct 25, 2007
|End Date=2015/12/18
+
|End Date=Oct 26, 2007
 +
|Academic Field=Computer Science
 
|Event Status=as scheduled
 
|Event Status=as scheduled
 
|Event Mode=on site
 
|Event Mode=on site
|City=JP/26/Kyoto
 
|Region=JP/26
 
|Country=Country:JP
 
|Type=Conference
 
|Year=2015
 
|Homepage=https://ieee-vnc.org/2015/
 
|wikicfpId=44959
 
|ISBN=978-1-4673-9411-6
 
|wikidataid=Q109551424
 
|pageEditor=Th
 
|pageCreator=User:Curator 11
 
|contributionType=1
 
 
}}
 
}}
 +
{{Event Deadline
 +
|Abstract Deadline=Aug 18, 2007
 +
|Submission Deadline=Oct 6, 2007
 +
}}
 +
{{Event Deadline}}
 +
{{S Event}}
 +
 +
<pre></pre>This CfP was obtained from [http://www.wikicfp.com/cfp/servlet/event.showcfp?eventid=1366&amp;copyownerid=2 WikiCFP]

Revision as of 21:13, 22 September 2022

Deadlines
2007-08-18
2007-10-06
Deadlines
Venue

JP/26/Kyoto, JP/26, Japan

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This CfP was obtained from WikiCFP

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