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{{Event | {{Event | ||
− | |Acronym= | + | |Acronym=DBT 2007 |
− | |Title= | + | |Title=IEEE International Workshop on Current and Defect Based Testing |
− | | | + | |Type=Workshop |
− | | | + | |Homepage=dbt.tttc-events.org |
+ | |City=Santa Clara | ||
+ | |State=CA | ||
+ | |Country=Country:US | ||
+ | |wikicfpId=1366 | ||
+ | |pageCreator=127.0.0.1 | ||
+ | |contributionType=1 | ||
|Single Day Event=no | |Single Day Event=no | ||
− | |Start Date= | + | |Start Date=Oct 25, 2007 |
− | |End Date= | + | |End Date=Oct 26, 2007 |
+ | |Academic Field=Computer Science | ||
|Event Status=as scheduled | |Event Status=as scheduled | ||
|Event Mode=on site | |Event Mode=on site | ||
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}} | }} | ||
+ | {{Event Deadline | ||
+ | |Abstract Deadline=Aug 18, 2007 | ||
+ | |Submission Deadline=Oct 6, 2007 | ||
+ | }} | ||
+ | {{Event Deadline}} | ||
+ | {{S Event}} | ||
+ | |||
+ | <pre></pre>This CfP was obtained from [http://www.wikicfp.com/cfp/servlet/event.showcfp?eventid=1366&copyownerid=2 WikiCFP] |
Revision as of 21:13, 22 September 2022
Deadlines
Deadlines
Venue
JP/26/Kyoto, JP/26, Japan
Warning: Venue is missing. The map might not show the exact location.
This CfP was obtained from WikiCFP