Difference between revisions of "Event:SIGMETRICS 2004"

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{{Event
 
{{Event
|Acronym=SIGMETRICS '04
+
|Acronym=SIGMETRICS 2004
|Title=International Conference on Measurement and Modeling of Computer Systems 2004
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|Title=International Conference on Measurement and Modeling of Computer Systems
 
|In Event Series=Event Series:SIGMETRICS
 
|In Event Series=Event Series:SIGMETRICS
 
|Single Day Event=no
 
|Single Day Event=no
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|Event Status=as scheduled
 
|Event Status=as scheduled
 
|Event Mode=on site
 
|Event Mode=on site
|City=New York
+
|City=New York City
 +
|Region=New York
 
|Country=Country:US
 
|Country=Country:US
|Academic Field=Computer Science
+
|Academic Field=Computer Science; Computer System
 +
|Official Website=http://acm.org/sigmetrics/
 
|Type=Conference
 
|Type=Conference
|Homepage=acm.org/sigmetrics/
 
|Submitted papers=265
 
|Accepted papers=33
 
 
|pageCreator=User:Curator 89
 
|pageCreator=User:Curator 89
 
|pageEditor=User:Curator 89
 
|pageEditor=User:Curator 89
 
|contributionType=1
 
|contributionType=1
 
}}
 
}}
 +
{{Event Deadline}}
 +
{{Organizer
 +
|Contributor Type=organization
 +
|Organization=Special Interest Group on Measurement and Evaluation, Association for Computing Machinery
 +
}}
 +
{{Event Metric
 +
|Number Of Submitted Papers=265
 +
|Number Of Accepted Papers=33
 +
}}
 +
{{S Event}}

Latest revision as of 16:29, 4 November 2022

Deadlines
organization
Metrics
Submitted Papers
265
Accepted Papers
33
Venue

New York City, New York, United States of America

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