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{{Event | {{Event | ||
| − | |Acronym=SIGMETRICS | + | |Acronym=SIGMETRICS 2004 |
| − | |Title=International Conference on Measurement and Modeling of Computer Systems | + | |Title=International Conference on Measurement and Modeling of Computer Systems |
|In Event Series=Event Series:SIGMETRICS | |In Event Series=Event Series:SIGMETRICS | ||
|Single Day Event=no | |Single Day Event=no | ||
| Line 8: | Line 8: | ||
|Event Status=as scheduled | |Event Status=as scheduled | ||
|Event Mode=on site | |Event Mode=on site | ||
| − | |City=New York | + | |City=New York City |
| + | |Region=New York | ||
|Country=Country:US | |Country=Country:US | ||
| − | |Academic Field=Computer Science | + | |Academic Field=Computer Science; Computer System |
| + | |Official Website=http://acm.org/sigmetrics/ | ||
|Type=Conference | |Type=Conference | ||
| − | |||
|pageCreator=User:Curator 89 | |pageCreator=User:Curator 89 | ||
|pageEditor=User:Curator 89 | |pageEditor=User:Curator 89 | ||
Revision as of 13:18, 2 November 2022
Deadlines
Metrics
Submitted Papers
265
Accepted Papers
33
Venue
New York City, New York, United States of America
Warning: Venue is missing. The map might not show the exact location.
