(mobo import Concept___Event_For_Confident-migrated) |
(mobo import Concept___Events_With_Academic_Fields-migrated) |
||
| Line 3: | Line 3: | ||
|Title=IEEE International Workshop on Memory Technology, Design and Testing | |Title=IEEE International Workshop on Memory Technology, Design and Testing | ||
|Type=Workshop | |Type=Workshop | ||
| − | |||
|Homepage=www.ieee-mtdt.org | |Homepage=www.ieee-mtdt.org | ||
|City=Taipei | |City=Taipei | ||
| Line 15: | Line 14: | ||
|Start Date=Dec 3, 2007 | |Start Date=Dec 3, 2007 | ||
|End Date=Dec 5, 2007 | |End Date=Dec 5, 2007 | ||
| + | |Academic Field=Computer Science | ||
}} | }} | ||
<pre></pre>This CfP was obtained from [http://www.wikicfp.com/cfp/servlet/event.showcfp?eventid=1368&copyownerid=2 WikiCFP] | <pre></pre>This CfP was obtained from [http://www.wikicfp.com/cfp/servlet/event.showcfp?eventid=1368&copyownerid=2 WikiCFP] | ||
Revision as of 13:46, 24 August 2022
This CfP was obtained from WikiCFP
