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|Title=IEEE Circuits and Systems International Conference on Testing and Diagnosis | |Title=IEEE Circuits and Systems International Conference on Testing and Diagnosis | ||
|Type=Conference | |Type=Conference | ||
| − | | | + | |Official Website=http://ictd08.uestc.edu.cn/index.php?show=call4paper |
|City=Chengdu | |City=Chengdu | ||
|Region=Sichuan | |Region=Sichuan | ||
|Country=Country:CN | |Country=Country:CN | ||
| − | |||
|wikicfpId=2973 | |wikicfpId=2973 | ||
|pageCreator=127.0.0.1 | |pageCreator=127.0.0.1 | ||
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|Event Mode=on site | |Event Mode=on site | ||
}} | }} | ||
| + | {{Event Deadline | ||
| + | |Submission Deadline=Jun 15, 2008 | ||
| + | }} | ||
| + | {{S Event}} | ||
<pre></pre>This CfP was obtained from [http://www.wikicfp.com/cfp/servlet/event.showcfp?eventid=2973&copyownerid=2 WikiCFP] | <pre></pre>This CfP was obtained from [http://www.wikicfp.com/cfp/servlet/event.showcfp?eventid=2973&copyownerid=2 WikiCFP] | ||
Latest revision as of 15:23, 19 October 2022
Deadlines
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| Submission |
Venue
Chengdu, Sichuan, China
Warning: Venue is missing. The map might not show the exact location.
This CfP was obtained from WikiCFP
