(mobo import Concept___Event_For_Confident-migrated) |
Curator 91 (talk | contribs) |
||
| (9 intermediate revisions by 2 users not shown) | |||
| Line 1: | Line 1: | ||
{{Event | {{Event | ||
|Acronym=ICMTS 2022 | |Acronym=ICMTS 2022 | ||
| − | |Title= | + | |Title=International Conference on Microelectronic Test Structures 2022 |
|Ordinal=34 | |Ordinal=34 | ||
| + | |In Event Series=Event Series:ICMTS | ||
| + | |Single Day Event=no | ||
| + | |Start Date=2022/03/21 | ||
| + | |End Date=2022/03/24 | ||
| + | |Event Status=as scheduled | ||
| + | |Event Mode=online | ||
| + | |Academic Field=Microelectronics | ||
| + | |Official Website=http://icmts.if.t.u-tokyo.ac.jp | ||
| + | |DOI=10.25798/y5jk-4p57 | ||
|Type=Conference | |Type=Conference | ||
| − | |||
| − | |||
| − | |||
|Twitter account=@IEEE_ICMTS | |Twitter account=@IEEE_ICMTS | ||
| − | |||
| − | |||
| − | |||
| − | |||
|pageCreator=User:Curator 53 | |pageCreator=User:Curator 53 | ||
|pageEditor=User:Curator 53 | |pageEditor=User:Curator 53 | ||
|contributionType=1 | |contributionType=1 | ||
| − | |||
| − | |||
| − | |||
| − | |||
}} | }} | ||
| + | {{Event Deadline | ||
| + | |Submission Deadline=2021/10/29 | ||
| + | }} | ||
| + | {{Organizer | ||
| + | |Contributor Type=organization | ||
| + | |Organization=IEEE Electron Devices Society, Institute of Electrical and Electronics Engineers | ||
| + | }} | ||
| + | {{Event Metric}} | ||
| + | {{S Event}} | ||
Latest revision as of 08:33, 11 October 2023
Deadlines
|
||
| Submission |
Metrics
Venue
Warning: Venue is missing. The map might not show the exact location.
