(mobo import Concept___Events_With_Academic_Fields-migrated) |
Curator 91 (talk | contribs) |
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|Title=33rd IEEE International Conference on Microelectronic Test Structures | |Title=33rd IEEE International Conference on Microelectronic Test Structures | ||
|Ordinal=33 | |Ordinal=33 | ||
| + | |In Event Series=Event Series:ICMTS | ||
| + | |Single Day Event=no | ||
| + | |Start Date=2020/03/04 | ||
| + | |End Date=2020/03/18 | ||
|Type=Conference | |Type=Conference | ||
|Submission deadline=2021/10/29 | |Submission deadline=2021/10/29 | ||
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|pageEditor=User:Curator 53 | |pageEditor=User:Curator 53 | ||
|contributionType=1 | |contributionType=1 | ||
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}} | }} | ||
OpenResearchStack: 0.0.29
Confident: 1.9.10
