(mobo import Concept___Events_With_Academic_Fields-migrated) |
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|Title=33rd IEEE International Conference on Microelectronic Test Structures | |Title=33rd IEEE International Conference on Microelectronic Test Structures | ||
|Ordinal=33 | |Ordinal=33 | ||
+ | |In Event Series=Event Series:ICMTS | ||
+ | |Single Day Event=no | ||
+ | |Start Date=2020/05/04 | ||
+ | |End Date=2020/05/17 | ||
+ | |Event Status=as scheduled | ||
+ | |Event Mode=online | ||
+ | |Academic Field=Microelectronics | ||
+ | |Official Website=https://icmts.net/archives/program2020.html | ||
|Type=Conference | |Type=Conference | ||
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|gndId=1217717676 | |gndId=1217717676 | ||
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|has Proceedings Link=https://ieeexplore.ieee.org/servlet/opac?punumber=9104792 | |has Proceedings Link=https://ieeexplore.ieee.org/servlet/opac?punumber=9104792 | ||
|ISBN=978-1-7281-4008-7 | |ISBN=978-1-7281-4008-7 | ||
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|pageEditor=User:Curator 53 | |pageEditor=User:Curator 53 | ||
|contributionType=1 | |contributionType=1 | ||
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}} | }} | ||
+ | {{Event Deadline | ||
+ | |Submission Deadline=2021/10/29 | ||
+ | }} | ||
+ | {{Organizer | ||
+ | |Contributor Type=organization | ||
+ | |Organization=IEEE Electron Devices Society, Institute of Electrical and Electronics Engineers | ||
+ | }} | ||
+ | {{Event Metric}} | ||
+ | {{S Event}} |
Latest revision as of 13:47, 10 October 2023
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