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|Title=32nd IEEE International Conference on Microelectronic Test Structures | |Title=32nd IEEE International Conference on Microelectronic Test Structures | ||
|Ordinal=32 | |Ordinal=32 | ||
| + | |In Event Series=Event Series:ICMTS | ||
| + | |Single Day Event=no | ||
| + | |Start Date=2019/03/18 | ||
| + | |End Date=2019/03/21 | ||
| + | |Event Status=as scheduled | ||
| + | |Event Mode=on site | ||
| + | |Venue=International Conference Center | ||
| + | |City=Kitakyushu | ||
| + | |Region=Fukuoka | ||
| + | |Country=Country:JP | ||
| + | |Academic Field=Microelectronics | ||
| + | |Official Website=https://icmts.net/archives/program2019.html | ||
|Type=Conference | |Type=Conference | ||
|gndId=1194495664 | |gndId=1194495664 | ||
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|has Proceedings Link=https://ieeexplore.ieee.org/servlet/opac?punumber=8726168 | |has Proceedings Link=https://ieeexplore.ieee.org/servlet/opac?punumber=8726168 | ||
|ISBN=978-1-7281-1466-8 | |ISBN=978-1-7281-1466-8 | ||
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|pageEditor=User:Curator 53 | |pageEditor=User:Curator 53 | ||
|contributionType=1 | |contributionType=1 | ||
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}} | }} | ||
| + | {{Event Deadline}} | ||
| + | {{Organizer | ||
| + | |Contributor Type=organization | ||
| + | |Organization=IEEE Electron Devices Society, Institute of Electrical and Electronics Engineers | ||
| + | }} | ||
| + | {{Event Metric | ||
| + | |Number Of Accepted Papers=38 | ||
| + | }} | ||
| + | {{S Event}} | ||
Latest revision as of 13:51, 10 October 2023
Deadlines
Metrics
Accepted Papers
38
Venue
International Conference Center, Kitakyushu, Fukuoka, Japan
