(mobo import Concept___Events-migrated) |
Curator 91 (talk | contribs) |
||
| (3 intermediate revisions by one other user not shown) | |||
| Line 1: | Line 1: | ||
{{Event | {{Event | ||
|Acronym=ICMTS 2018 | |Acronym=ICMTS 2018 | ||
| − | |Title=IEEE International Conference on Microelectronic Test Structures | + | |Title=31st IEEE International Conference on Microelectronic Test Structures |
|Ordinal=31 | |Ordinal=31 | ||
|In Event Series=Event Series:ICMTS | |In Event Series=Event Series:ICMTS | ||
| Line 7: | Line 7: | ||
|Start Date=2018/03/19 | |Start Date=2018/03/19 | ||
|End Date=2018/03/22 | |End Date=2018/03/22 | ||
| + | |Event Status=as scheduled | ||
| + | |Event Mode=on site | ||
| + | |Venue=Courtyard Austin Downtown/Convention Center | ||
| + | |City=Austin | ||
| + | |Region=Texas | ||
| + | |Country=Country:US | ||
| + | |Academic Field=Microelectronics | ||
| + | |Official Website=https://icmts.net/archives/program2018.html | ||
|Type=Conference | |Type=Conference | ||
|gndId=1169681158 | |gndId=1169681158 | ||
| − | |||
| − | |||
| − | |||
|has Proceedings Link=https://ieeexplore.ieee.org/servlet/opac?punumber=8375243 | |has Proceedings Link=https://ieeexplore.ieee.org/servlet/opac?punumber=8375243 | ||
|has Proceedings link=https://ieeexplore.ieee.org/servlet/opac?punumber=8375243 | |has Proceedings link=https://ieeexplore.ieee.org/servlet/opac?punumber=8375243 | ||
| Line 18: | Line 23: | ||
|pageEditor=User:Curator 53 | |pageEditor=User:Curator 53 | ||
|contributionType=1 | |contributionType=1 | ||
| − | |||
| − | |||
}} | }} | ||
| + | {{Event Deadline}} | ||
| + | {{Organizer | ||
| + | |Contributor Type=organization | ||
| + | |Organization=IEEE Electron Devices Society, Institute of Electrical and Electronics Engineers | ||
| + | }} | ||
| + | {{Event Metric}} | ||
| + | {{S Event}} | ||
Latest revision as of 13:52, 10 October 2023
Deadlines
Metrics
Venue
Courtyard Austin Downtown/Convention Center, Austin, Texas, United States of America
