(mobo import Concept___Event_For_Confident-migrated) |
(mobo import Concept___Events_With_Academic_Fields-migrated) |
||
| Line 3: | Line 3: | ||
|Title=IEEE International Conference on Microelectronic Test Structures | |Title=IEEE International Conference on Microelectronic Test Structures | ||
|Type=Conference | |Type=Conference | ||
| − | |||
|Submission deadline=2008/09/15 | |Submission deadline=2008/09/15 | ||
|Homepage=www.see.ed.ac.uk/ICMTS | |Homepage=www.see.ed.ac.uk/ICMTS | ||
| Line 18: | Line 17: | ||
|Start Date=2009/03/30 | |Start Date=2009/03/30 | ||
|End Date=2009/04/02 | |End Date=2009/04/02 | ||
| + | |Academic Field=Uncategorized | ||
}} | }} | ||
<pre></pre>This CfP was obtained from [http://www.wikicfp.com/cfp/servlet/event.showcfp?eventid=2859&copyownerid=2 WikiCFP] | <pre></pre>This CfP was obtained from [http://www.wikicfp.com/cfp/servlet/event.showcfp?eventid=2859&copyownerid=2 WikiCFP] | ||
Revision as of 13:23, 24 August 2022
This CfP was obtained from WikiCFP
