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{{Event | {{Event | ||
|Acronym=ICMTS 2009 | |Acronym=ICMTS 2009 | ||
| − | |Title=IEEE International Conference on Microelectronic Test Structures | + | |Title=IEEE International Conference on Microelectronic Test Structures 2009 |
|In Event Series=Event Series:ICMTS | |In Event Series=Event Series:ICMTS | ||
|Single Day Event=no | |Single Day Event=no | ||
|Start Date=2009/03/30 | |Start Date=2009/03/30 | ||
|End Date=2009/04/02 | |End Date=2009/04/02 | ||
| + | |Event Status=as scheduled | ||
| + | |Event Mode=on site | ||
| + | |City=Oxnard | ||
| + | |Region=California | ||
| + | |Country=Country:US | ||
| + | |Academic Field=Microelectronics | ||
| + | |Official Website=http://www.see.ed.ac.uk/ICMTS | ||
|Type=Conference | |Type=Conference | ||
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|wikicfpId=2859 | |wikicfpId=2859 | ||
|pageCreator=127.0.0.1 | |pageCreator=127.0.0.1 | ||
| Line 18: | Line 19: | ||
|contributionType=1 | |contributionType=1 | ||
}} | }} | ||
| + | {{Event Deadline | ||
| + | |Submission Deadline=2008/09/15 | ||
| + | }} | ||
| + | {{Organizer | ||
| + | |Contributor Type=organization | ||
| + | |Organization=IEEE Electron Devices Society, Institute of Electrical and Electronics Engineers | ||
| + | }} | ||
| + | {{Event Metric}} | ||
| + | {{S Event}} | ||
<pre></pre>This CfP was obtained from [http://www.wikicfp.com/cfp/servlet/event.showcfp?eventid=2859&copyownerid=2 WikiCFP] | <pre></pre>This CfP was obtained from [http://www.wikicfp.com/cfp/servlet/event.showcfp?eventid=2859&copyownerid=2 WikiCFP] | ||
Latest revision as of 13:55, 10 October 2023
Deadlines
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| Submission |
Metrics
Venue
Oxnard, California, United States of America
Warning: Venue is missing. The map might not show the exact location.
This CfP was obtained from WikiCFP
