(mobo import Concept___Fix_Presence-migrated) |
(mobo import Concept___Events-migrated) |
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|Title=IEEE International Conference on Microelectronic Test Structures | |Title=IEEE International Conference on Microelectronic Test Structures | ||
|Type=Conference | |Type=Conference | ||
| − | |||
|Homepage=www.ee.ed.ac.uk/ICMTS | |Homepage=www.ee.ed.ac.uk/ICMTS | ||
|City=Edinburgh | |City=Edinburgh | ||
|Country=Country:GB | |Country=Country:GB | ||
| − | |||
|wikicfpId=1448 | |wikicfpId=1448 | ||
|pageCreator=127.0.0.1 | |pageCreator=127.0.0.1 | ||
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|Event Mode=on site | |Event Mode=on site | ||
}} | }} | ||
| + | {{Event Deadline | ||
| + | |Abstract Deadline=2007/09/14 | ||
| + | |Submission Deadline=2008/01/07 | ||
| + | }} | ||
| + | {{S Event}} | ||
<pre></pre>This CfP was obtained from [http://www.wikicfp.com/cfp/servlet/event.showcfp?eventid=1448&copyownerid=2 WikiCFP] | <pre></pre>This CfP was obtained from [http://www.wikicfp.com/cfp/servlet/event.showcfp?eventid=1448&copyownerid=2 WikiCFP] | ||
Revision as of 19:59, 22 September 2022
Deadlines
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| Abstract |
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| Submission |
Venue
Appleton Tower, Edinburgh, Edinburgh, City of, United Kingdom of Great Britain and Northern Ireland
This CfP was obtained from WikiCFP
