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{{Event | {{Event | ||
|Acronym=ICMTS 2008 | |Acronym=ICMTS 2008 | ||
| − | |Title=IEEE International Conference on Microelectronic Test Structures | + | |Title=IEEE International Conference on Microelectronic Test Structures 2008 |
| + | |In Event Series=Event Series:ICMTS | ||
| + | |Single Day Event=no | ||
| + | |Start Date=2008/03/24 | ||
| + | |End Date=2008/03/27 | ||
| + | |Event Status=as scheduled | ||
| + | |Event Mode=on site | ||
| + | |Venue=Appleton Tower | ||
| + | |City=Edinburgh | ||
| + | |Region=Edinburgh, City of | ||
| + | |Country=Country:GB | ||
| + | |Academic Field=Microelectronics | ||
| + | |Official Website=http://www.ee.ed.ac.uk/ICMTS | ||
|Type=Conference | |Type=Conference | ||
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|wikicfpId=1448 | |wikicfpId=1448 | ||
|pageCreator=127.0.0.1 | |pageCreator=127.0.0.1 | ||
|pageEditor=User:Curator 53 | |pageEditor=User:Curator 53 | ||
|contributionType=1 | |contributionType=1 | ||
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}} | }} | ||
| + | {{Event Deadline | ||
| + | |Abstract Deadline=2007/09/14 | ||
| + | |Submission Deadline=2008/01/07 | ||
| + | }} | ||
| + | {{Organizer | ||
| + | |Contributor Type=organization | ||
| + | |Organization=IEEE Electron Devices Society, Institute of Electrical and Electronics Engineers | ||
| + | }} | ||
| + | {{Event Metric}} | ||
| + | {{S Event}} | ||
<pre></pre>This CfP was obtained from [http://www.wikicfp.com/cfp/servlet/event.showcfp?eventid=1448&copyownerid=2 WikiCFP] | <pre></pre>This CfP was obtained from [http://www.wikicfp.com/cfp/servlet/event.showcfp?eventid=1448&copyownerid=2 WikiCFP] | ||
Latest revision as of 13:56, 10 October 2023
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Venue
Appleton Tower, Edinburgh, Edinburgh, City of, United Kingdom of Great Britain and Northern Ireland
This CfP was obtained from WikiCFP
