(mobo import Concept___Event_For_Confident-migrated) |
(mobo import Concept___Events_With_Academic_Fields-migrated) |
||
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|Title=19th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis | |Title=19th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis | ||
|Type=Conference | |Type=Conference | ||
− | |||
|Homepage=esref2008.ewi.utwente.nl/CFP_ESREF08.pdf | |Homepage=esref2008.ewi.utwente.nl/CFP_ESREF08.pdf | ||
|City=Maastricht | |City=Maastricht | ||
Line 14: | Line 13: | ||
|Start Date=Sep 29, 2008 | |Start Date=Sep 29, 2008 | ||
|End Date=Oct 2, 2008 | |End Date=Oct 2, 2008 | ||
+ | |Academic Field=Computer Security And Reliability | ||
}} | }} | ||
<pre></pre>This CfP was obtained from [http://www.wikicfp.com/cfp/servlet/event.showcfp?eventid=2446&copyownerid=2 WikiCFP] | <pre></pre>This CfP was obtained from [http://www.wikicfp.com/cfp/servlet/event.showcfp?eventid=2446&copyownerid=2 WikiCFP] |
Revision as of 13:06, 24 August 2022
This CfP was obtained from WikiCFP