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|Title=23rd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems | |Title=23rd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems | ||
|Type=Conference | |Type=Conference | ||
| − | | | + | |Official Website=http://www.dfts.org/cfp.html |
|City=Cambridge | |City=Cambridge | ||
| − | | | + | |Region=MA |
|Country=Country:US | |Country=Country:US | ||
| − | |||
|wikicfpId=2798 | |wikicfpId=2798 | ||
|pageCreator=127.0.0.1 | |pageCreator=127.0.0.1 | ||
| Line 18: | Line 17: | ||
|Event Mode=on site | |Event Mode=on site | ||
}} | }} | ||
| + | {{Event Deadline | ||
| + | |Submission Deadline=Jul 14, 2008 | ||
| + | }} | ||
| + | {{S Event}} | ||
<pre></pre>This CfP was obtained from [http://www.wikicfp.com/cfp/servlet/event.showcfp?eventid=2798&copyownerid=2 WikiCFP][[Category:VLSI design]] | <pre></pre>This CfP was obtained from [http://www.wikicfp.com/cfp/servlet/event.showcfp?eventid=2798&copyownerid=2 WikiCFP][[Category:VLSI design]] | ||
Latest revision as of 14:44, 19 October 2022
Deadlines
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| Submission |
Venue
Cambridge, MA, United States of America
Warning: Venue is missing. The map might not show the exact location.
This CfP was obtained from WikiCFP
