(mobo import Concept___Event_For_Confident-migrated) |
(mobo import Concept___Events_With_Academic_Fields-migrated) |
||
| Line 3: | Line 3: | ||
|Title=23rd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems | |Title=23rd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems | ||
|Type=Conference | |Type=Conference | ||
| − | |||
|Homepage=www.dfts.org/cfp.html | |Homepage=www.dfts.org/cfp.html | ||
|City=Cambridge | |City=Cambridge | ||
| Line 15: | Line 14: | ||
|Start Date=May 7, 2008 | |Start Date=May 7, 2008 | ||
|End Date=Oct 3, 2008 | |End Date=Oct 3, 2008 | ||
| + | |Academic Field=Computer Architecture | ||
}} | }} | ||
<pre></pre>This CfP was obtained from [http://www.wikicfp.com/cfp/servlet/event.showcfp?eventid=2798&copyownerid=2 WikiCFP][[Category:VLSI design]] | <pre></pre>This CfP was obtained from [http://www.wikicfp.com/cfp/servlet/event.showcfp?eventid=2798&copyownerid=2 WikiCFP][[Category:VLSI design]] | ||
Revision as of 13:01, 24 August 2022
This CfP was obtained from WikiCFP
