m (Text replacement - "=User:Curator 83" to "=Ch") |
(mobo import Concept___Events_With_Academic_Fields-migrated) |
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| Line 3: | Line 3: | ||
|Title=IEEE International Workshop on Electronic Design, Test and Application | |Title=IEEE International Workshop on Electronic Design, Test and Application | ||
|Type=Workshop | |Type=Workshop | ||
| − | |||
|Homepage=www.ece.ust.hk/delta2008/Call.htm | |Homepage=www.ece.ust.hk/delta2008/Call.htm | ||
|City=Kowloon | |City=Kowloon | ||
| Line 15: | Line 14: | ||
|Start Date=Jan 23, 2008 | |Start Date=Jan 23, 2008 | ||
|End Date=Jan 25, 2008 | |End Date=Jan 25, 2008 | ||
| + | |Academic Field=Computer Science | ||
}} | }} | ||
<pre></pre>This CfP was obtained from [http://www.wikicfp.com/cfp/servlet/event.showcfp?eventid=1460&copyownerid=2 WikiCFP] | <pre></pre>This CfP was obtained from [http://www.wikicfp.com/cfp/servlet/event.showcfp?eventid=1460&copyownerid=2 WikiCFP] | ||
Revision as of 13:00, 24 August 2022
This CfP was obtained from WikiCFP
