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|Title=IEEE International Workshop on Current and Defect Based Testing | |Title=IEEE International Workshop on Current and Defect Based Testing | ||
|Type=Workshop | |Type=Workshop | ||
| − | | | + | |Official Website=http://dbt.tttc-events.org |
|City=Santa Clara | |City=Santa Clara | ||
| − | | | + | |Region=CA |
|Country=Country:US | |Country=Country:US | ||
| − | |||
| − | |||
|wikicfpId=1366 | |wikicfpId=1366 | ||
|pageCreator=127.0.0.1 | |pageCreator=127.0.0.1 | ||
| Line 19: | Line 17: | ||
|Event Mode=on site | |Event Mode=on site | ||
}} | }} | ||
| + | {{Event Deadline | ||
| + | |Abstract Deadline=Aug 18, 2007 | ||
| + | |Submission Deadline=Oct 6, 2007 | ||
| + | }} | ||
| + | {{S Event}} | ||
<pre></pre>This CfP was obtained from [http://www.wikicfp.com/cfp/servlet/event.showcfp?eventid=1366&copyownerid=2 WikiCFP] | <pre></pre>This CfP was obtained from [http://www.wikicfp.com/cfp/servlet/event.showcfp?eventid=1366&copyownerid=2 WikiCFP] | ||
Latest revision as of 14:45, 19 October 2022
Deadlines
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Venue
Santa Clara, CA, United States of America
Warning: Venue is missing. The map might not show the exact location.
This CfP was obtained from WikiCFP
