(mobo import Concept___Event_For_Confident-migrated) |
(mobo import Concept___Events_With_Academic_Fields-migrated) |
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|Title=IEEE/CPMT 24th Semiconductor Thermal Measurement, Modeling & Management Symposium | |Title=IEEE/CPMT 24th Semiconductor Thermal Measurement, Modeling & Management Symposium | ||
|Type=Conference | |Type=Conference | ||
| − | |||
|Homepage=www.semi-therm.org | |Homepage=www.semi-therm.org | ||
|City=San Jose | |City=San Jose | ||
| Line 16: | Line 15: | ||
|Start Date=Mar 16, 2008 | |Start Date=Mar 16, 2008 | ||
|End Date=Mar 20, 2008 | |End Date=Mar 20, 2008 | ||
| + | |Academic Field=Manufacturing | ||
}} | }} | ||
Revision as of 13:59, 24 August 2022
The abstract should be between 2 and 5 pages of single spaced text giving the key results, findings and conclusions, supported by additional pages of figures tables and references as appropriate. Abstracts must demonstrate that proposed papers are appropriate for SEMI-THERM and of high technical quality.
This CfP was obtained from WikiCFP
